Title :
Scanning Microwave Near-Field Microscope Based on the Multiport Technology
Author :
Haddadi, Kamel ; Lasri, Tuami
Author_Institution :
Inst. d´Electron., de Microelectron. et de Nanotechnol., Univ. Lille 1, Villeneuve-d´Ascq, France
Abstract :
A multiport based near field high frequency microscope is proposed for local nondestructive evaluation and testing applications. The combination of the multiport technology and near-field microscopy methods present advantages such as low cost, compactness, real-time operation, high spatial resolution and versatility. In particular, experimental demonstrations of a multiport near-field microscope is described in microwave frequency range. The spatial resolution of the instrument is experimentally verified to evaluate the performance of the technique proposed.
Keywords :
acoustic microscopy; microwave measurement; nondestructive testing; compactness; high spatial resolution; local nondestructive evaluation; microwave frequency range; multiport near-field microscope; near-field microscopy methods; real-time operation; scanning microwave near-field microscope; testing applications; Microscopy; Microwave measurement; Microwave technology; Microwave theory and techniques; Nondestructive testing; Spatial resolution; Microwave sensing; multiport; near-field microwave microscopy; nondestructive testing; six-port;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2013.2270918
