Title :
Machine Learning for Predictive Maintenance: A Multiple Classifier Approach
Author :
Susto, Gian Antonio ; Schirru, Andrea ; Pampuri, Simone ; McLoone, Sean ; Beghi, Alessandro
Author_Institution :
Dept. of Inf. Eng., Univ. of Padova, Padua, Italy
Abstract :
In this paper, a multiple classifier machine learning (ML) methodology for predictive maintenance (PdM) is presented. PdM is a prominent strategy for dealing with maintenance issues given the increasing need to minimize downtime and associated costs. One of the challenges with PdM is generating the so-called “health factors,” or quantitative indicators, of the status of a system associated with a given maintenance issue, and determining their relationship to operating costs and failure risk. The proposed PdM methodology allows dynamical decision rules to be adopted for maintenance management, and can be used with high-dimensional and censored data problems. This is achieved by training multiple classification modules with different prediction horizons to provide different performance tradeoffs in terms of frequency of unexpected breaks and unexploited lifetime, and then employing this information in an operating cost-based maintenance decision system to minimize expected costs. The effectiveness of the methodology is demonstrated using a simulated example and a benchmark semiconductor manufacturing maintenance problem.
Keywords :
data mining; learning (artificial intelligence); pattern classification; production engineering computing; semiconductor device manufacture; PdM; censored data problem; data mining; dynamical decision rules; health factors; high-dimensional problem; maintenance management; multiple classifier machine learning methodology; operating cost-based maintenance decision system; predictive maintenance; quantitative indicators; semiconductor manufacturing maintenance problem; Availability; Informatics; Manufacturing; Predictive maintenance; Production; Training; Classification algorithms; data mining; ion implantation; machine learning (ML); predictive maintenance (PdM); semiconductor device manufacture;
Journal_Title :
Industrial Informatics, IEEE Transactions on
DOI :
10.1109/TII.2014.2349359