DocumentCode :
3139086
Title :
Quantum well intermixing in InGaAs/(Al)GaAs by As and H irradiation
Author :
Fu, L. ; Tan, H.H. ; Jagadish, C. ; Johnston, M.B. ; Gal, M.
Author_Institution :
Dept. of Electron. Mater. Eng., Australian Nat. Univ., Canberra, ACT, Australia
fYear :
1999
fDate :
1999
Firstpage :
355
Lastpage :
357
Abstract :
As and H irradiation with subsequent thermal annealing were used to investigate the intermixing of InGaAs/GaAs and InGaAs/AlGaAs quantum wells (QWs). Large photoluminescence (PL) energy shifts were observed in both materials, Due to dynamic annealing in AlGaAs and the presence of Al in the barriers, the InGaAs/AlGaAs samples showed better PL intensities recovery and larger energy shifts than the InGaAs/GaAs samples after both As and H irradiation. Larger energy shifts were obtained for As irradiation at lower doses than when compared to H irradiation, However, at higher doses H irradiation resulted in higher energy shift than As irradiation, Results of the effect of irradiation temperature showed that higher shift could be obtained with increasing temperature for As irradiation at lower doses while for H irradiation, implant temperature had little effect
Keywords :
III-V semiconductors; aluminium compounds; annealing; gallium arsenide; indium compounds; ion beam effects; photoluminescence; semiconductor quantum wells; surface diffusion; As; As irradiation; H; H irradiation; InAs-AlGaAs; InGaAs/(Al)GaAs; dynamic annealing; implant temperature; large photoluminescence energy shifts; quantum well intermixing; thermal annealing; Epitaxial growth; Gallium arsenide; Indium gallium arsenide; Ion implantation; Photoluminescence; Physics; Power engineering and energy; Rapid thermal annealing; Substrates; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optoelectronic and Microelectronic Materials Devices, 1998. Proceedings. 1998 Conference on
Conference_Location :
Perth, WA
Print_ISBN :
0-7803-4513-4
Type :
conf
DOI :
10.1109/COMMAD.1998.791661
Filename :
791661
Link To Document :
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