Title :
Morphotropic phase boundary and microstructure of low-temperature sintered PZT ceramics with BiFeO3 and Ba(Cu0.5W 0.5)O3
Author :
Murakami, Kenji ; Okada, Nagaya ; Dong, Dunzhuo ; Kaneko, Shoji
Author_Institution :
Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan
Abstract :
The sintering temperature of the 0.5 wt% MnO2-added Pb(Zr0.53Ti0.47)O3 ceramics was successfully lowered down to 935°C by the addition of the complex oxides, BiFeO3 and Ba(Cu0.5W0.5)O3 . This addition may cause a shift of the morphotropic phase boundary (MPB) at which the Pb(Zr,Ti)O3 ceramics shows excellent piezoelectric and dielectric properties. Indeed, the XRD studies reveal that the MPB of the ceramics with additives shifts toward the Ti-rich composition. Thus, the electrical properties are affected by this shift of the MPB and the optimum Zr/Ti ratio of 52/48 is determined. Furthermore, the microstructural analyses by using SEM indicate that the additives seem to form stable grain boundaries and the most stable boundaries are obtained with the corresponding composition
Keywords :
X-ray diffraction; barium compounds; bismuth compounds; ceramics; grain boundaries; lead compounds; manganese compounds; optical susceptibility; piezoceramics; scanning electron microscopy; sintering; 935 degC; PZT-MnO2-BaCu0.5W0.5O3; PZT-MnO2-BiFeO3; PbZrO3TiO3-MnO2-BaCu0.5W0.5O3; PbZrO3TiO3-MnO2-BiFeO3; SEM; Ti-rich composition; Zr/Ti ratio; ceramics; dielectric susceptibility; ferroelectric; microstructure; morphotropic phase boundary; piezoelectric properties; sintering temperature; stable grain boundaries; Additives; Ceramics; Dielectrics; Grain boundaries; Lattices; Materials science and technology; Microstructure; Scanning electron microscopy; Temperature; X-ray scattering;
Conference_Titel :
Applications of Ferroelectrics, 1994.ISAF '94., Proceedings of the Ninth IEEE International Symposium on
Conference_Location :
University Park, PA
Print_ISBN :
0-7803-1847-1
DOI :
10.1109/ISAF.1994.522287
