Title :
Design automation methodology for improving the variability of synthesized digital circuits operating in the sub/near-threshold regime
Author :
Crop, Joseph ; Pawlowski, Robert ; Moezzi-Madani, Nariman ; Jackson, Jarrod ; Chaing, Patrick
Author_Institution :
Sch. of EECS, Oregon State Univ., Corvallis, OR, USA
Abstract :
Ultra-low power digital circuit design using sub-threshold supply voltages has recently been popularized for energy-constrained systems, sensor networks and bio-sensor applications. The conventional method to improve digital circuit operation in the sub-threshold region is to design every logic cell manually, requiring complete re-design and re-characterization for every process node. This proposed work introduces a computational design automation that tests every cell in a standard cell library for proper operation in the sub-threshold region, eliminating cells that perform poorly. The result of this culling process is improved sub-/near-threshold operation for any standard cell library, improving delay, area, and energy. Monte-Carlo simulation results of a synthesized 90nm-CMOS Floating-Point Adder verifies improved mean timing delay (32%) and overall energy per computation (37%) of the culled standard cell library design over a regular synthesized design.
Keywords :
CMOS digital integrated circuits; Monte Carlo methods; adders; electronic design automation; integrated circuit design; logic circuits; low-power electronics; CMOS floating-point adder; Monte-Carlo simulation; biosensor applications; computational design automation; culling process; energy-constrained systems; logic cell; regular synthesized design; sensor networks; size 90 nm; standard cell library; sub-near-threshold regime; subthreshold supply voltages; synthesized digital circuit variability; ultra-low power digital circuit design; Computer architecture; Delay; Flip-flops; Leakage current; Libraries; Microprocessors; Design Automation; Sub-Threshold; Variation Reduction;
Conference_Titel :
Green Computing Conference and Workshops (IGCC), 2011 International
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4577-1222-7
DOI :
10.1109/IGCC.2011.6008604