Title :
Low power testing - What can commercial DFT tools provide?
Author_Institution :
Mentor Graphics Corp., Wilsonville, OR, USA
Abstract :
Minimizing power consumption during functional operation and during manufacturing test has become one of the dominant requirements for the semiconductor designs in the past decade. From commercial DFT tool point of view, this paper describes the capabilities the DFT tools can provide to achieve comprehensive testing of low power designs as well as to reduce test power consumption during test application.
Keywords :
integrated circuit design; low-power electronics; manufacturing processes; power consumption; commercial DFT tools p; design-for-test; low power designs; low power testing; semiconductor designs; test application; test power consumption; Automatic test pattern generation; Clocks; Discrete Fourier transforms; Logic gates; Power demand; Switches;
Conference_Titel :
Green Computing Conference and Workshops (IGCC), 2011 International
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4577-1222-7
DOI :
10.1109/IGCC.2011.6008609
