• DocumentCode
    3139412
  • Title

    Low power testing - What can commercial DFT tools provide?

  • Author

    Lin, Xijiang

  • Author_Institution
    Mentor Graphics Corp., Wilsonville, OR, USA
  • fYear
    2011
  • fDate
    25-28 July 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Minimizing power consumption during functional operation and during manufacturing test has become one of the dominant requirements for the semiconductor designs in the past decade. From commercial DFT tool point of view, this paper describes the capabilities the DFT tools can provide to achieve comprehensive testing of low power designs as well as to reduce test power consumption during test application.
  • Keywords
    integrated circuit design; low-power electronics; manufacturing processes; power consumption; commercial DFT tools p; design-for-test; low power designs; low power testing; semiconductor designs; test application; test power consumption; Automatic test pattern generation; Clocks; Discrete Fourier transforms; Logic gates; Power demand; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Green Computing Conference and Workshops (IGCC), 2011 International
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4577-1222-7
  • Type

    conf

  • DOI
    10.1109/IGCC.2011.6008609
  • Filename
    6008609