• DocumentCode
    3139636
  • Title

    Application of extreme value distribution to model propagation fading in indoor mobile radio environments

  • Author

    Molina-García, Mariano ; Fernández-Durán, Alfonso ; Alonso, José I.

  • Author_Institution
    Univ. Polytech. de Madrid, Madrid
  • fYear
    2008
  • fDate
    22-24 Jan. 2008
  • Firstpage
    97
  • Lastpage
    100
  • Abstract
    In indoor mobile radio environments, the signal strength received in a mobile terminal vary due to amplitude fading that can be modelled by several distributions, such as Lognormal, Rayleigh, Rice, Nakagami, Suzuki or Weibull. Unfortunately, the application of these models does not allow to obtain analytical expressions that relate a signal strength value with mean value and typical deviation of the signal strength and the probability of signal strength to exceed the fixed value. In this paper, Extreme Value distribution is proposed to model fading in indoor propagation environments, in order to achieve closed analytical expressions to characterize probability distribution function and cumulative distribution function of signal strength and, by means of this, to relate by analytical expressions the signal threshold and the probability of signal strength to be above that threshold.
  • Keywords
    fading channels; higher order statistics; indoor radio; mobile radio; statistical distributions; amplitude fading; cumulative distribution function; extreme value distribution; indoor mobile radio environments; mobile terminal; model propagation fading; probability distribution function; signal strength; Distribution functions; Indoor environments; Land mobile radio; Nakagami distribution; Probability density function; Rayleigh channels; Signal analysis; Weibull distribution; Weibull fading channels; Wireless LAN; Amplitude Fading; Cumulative Distribution Function; Extreme Value Distribution; Indoor Environment; Probability Density Function; Weibull;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio and Wireless Symposium, 2008 IEEE
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4244-1462-8
  • Electronic_ISBN
    978-1-4244-1463-5
  • Type

    conf

  • DOI
    10.1109/RWS.2008.4463437
  • Filename
    4463437