• DocumentCode
    3139786
  • Title

    Testing ASICs at-speed

  • Author

    Gauthron, Christophe

  • Author_Institution
    COMPASS Design Autom., San Jose, CA, USA
  • fYear
    1991
  • fDate
    27-31 May 1991
  • Firstpage
    328
  • Lastpage
    332
  • Abstract
    At-speed test of ASICs is effective to detect delay faults, however, strobing is difficult because of process variations. In this paper two methodologies to generate at-speed test vectors are described. One is based on the comparison and merger of simulation traces obtained with different timing conditions. The other is a two-pass test approach.<>
  • Keywords
    application specific integrated circuits; delays; digital integrated circuits; fault location; integrated circuit testing; ASICs; at-speed test vectors; delay faults; test vector generation; Application specific integrated circuits; Automatic testing; Circuit faults; Circuit testing; Clocks; Design automation; Fixtures; Propagation delay; System testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Euro ASIC '91
  • Conference_Location
    Paris, France
  • Print_ISBN
    0-8186-2185-0
  • Type

    conf

  • DOI
    10.1109/EUASIC.1991.212843
  • Filename
    212843
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3139786