Title :
Testing ASICs at-speed
Author :
Gauthron, Christophe
Author_Institution :
COMPASS Design Autom., San Jose, CA, USA
Abstract :
At-speed test of ASICs is effective to detect delay faults, however, strobing is difficult because of process variations. In this paper two methodologies to generate at-speed test vectors are described. One is based on the comparison and merger of simulation traces obtained with different timing conditions. The other is a two-pass test approach.<>
Keywords :
application specific integrated circuits; delays; digital integrated circuits; fault location; integrated circuit testing; ASICs; at-speed test vectors; delay faults; test vector generation; Application specific integrated circuits; Automatic testing; Circuit faults; Circuit testing; Clocks; Design automation; Fixtures; Propagation delay; System testing; Timing;
Conference_Titel :
Euro ASIC '91
Conference_Location :
Paris, France
Print_ISBN :
0-8186-2185-0
DOI :
10.1109/EUASIC.1991.212843
