Title :
A digital CMOS fully connected neural network with in-circuit learning capability and automatic identification of spurious attractors
Author :
Gascuel, Jean-Dominique ; Weinfeld, Michel ; Chakroun, Sami
Author_Institution :
Lab. d´´Inf., Ecole Polytech., Palaiseau, France
Abstract :
Describes a completely connected feedback network with 64 binary neurons, using digital CMOS technology. The architecture implements a linear systolic loop, in which each neuron stores locally its own synaptic coefficients, and the potential calculation needs N time steps, each performing N partial weighted sums, to realize the N/sup 2/ operations needed. It implements internal learning capabilities, using the Widrow-Hoff rule, which converges towards the pseudo-inverse rule by iteration, thus allowing partial correlation between prototypes, and a higher capacity, compared to the Hebb rule. Also, it implements an internal mechanism for detecting relaxations on spurious states. The average retrieval speed is about 20 mu s, whereas the learning time is approximately 15 to 30 ms for 15 moderately correlated prototypes.<>
Keywords :
CMOS integrated circuits; VLSI; application specific integrated circuits; digital integrated circuits; neural nets; 15 to 30 ms; 20 mus; 64 binary neurons; Eurochip; Hopfield network; N partial weighted sums; N time steps; N/sup 2/ operations; Widrow-Hoff rule; automatic identification of spurious attractors; completely connected feedback network; detecting relaxations on spurious states; digital CMOS technology; digital neural network; fully connected neural network; in-circuit learning capability; internal learning capabilities; learning time; linear systolic loop; own synaptic coefficients; partial correlation between prototypes; pseudo-inverse rule; retrieval speed; spurious states detection; CMOS technology; Circuits; Computer architecture; Convergence; Neural networks; Neurofeedback; Neurons; Routing; Signal design; Storage automation;
Conference_Titel :
Euro ASIC '91
Conference_Location :
Paris, France
Print_ISBN :
0-8186-2185-0
DOI :
10.1109/EUASIC.1991.212858