Title :
ACC: automatic cell characterization
Author :
Anshumali, Kumar
Author_Institution :
SGS-Thomson Microelectron., Milan, Italy
Abstract :
The advent of aggressive submicron-VLSI technologies requires an accompanying development in characterization-tools. The large number and diversity of library-components and their multidimensional parameters makes it imperative to employ a fast and automatic flow embodying rigorous methodologies to accomplish the task of library-characterization. This paper describes the ACC (Automatic Cell Characterization) system which combines generic operation, fast electrical simulation and numerical analysis to automatically characterize a library in a multidimensional manner.<>
Keywords :
VLSI; cellular arrays; circuit layout CAD; digital simulation; integrated logic circuits; automatic cell characterization; characterization-tools; fast electrical simulation; generic characterization library; generic operation; library-characterization; multidimensional manner; multidimensional parameters; numerical analysis; submicron-VLSI technologies; Analytical models; Character generation; Libraries; Microelectronics; Multidimensional systems; Specification languages; Temperature distribution; Threshold voltage; Timing; Voltage control;
Conference_Titel :
Euro ASIC '91
Conference_Location :
Paris, France
Print_ISBN :
0-8186-2185-0
DOI :
10.1109/EUASIC.1991.212866
