• DocumentCode
    3140575
  • Title

    A generic model for the classification of radiation emission data in electromagnetic compatibility measurement

  • Author

    Awan, F.G. ; Sheikh, N.M. ; Qureshi, S.A. ; Ali, Ahmad

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Eng. & Technol., Lahore, Pakistan
  • fYear
    2008
  • fDate
    22-24 Jan. 2008
  • Firstpage
    315
  • Lastpage
    318
  • Abstract
    This paper presents a generic model for identification of Radiation energy in open area-test site (OATS) with noisy environment. This model incorporates important effects including, interdependency of direction of propagation of radiated energy, precision of transducers and noise profiles. We propose a statistical based model to measure radiated Electromagnetic Interference in OATS environment for classification of radiated emission data either being source generated or an ambient. FAM algorithm is then modified to critically categorize ambient concealed in signal data; its performance has been improved and "undefined" points in earlier investigation have been modeled. Any electronic product can well be tested for Radiated emissions against CISPR standards in OATS.
  • Keywords
    electromagnetic compatibility; electromagnetic interference; open area test sites; signal classification; statistical analysis; electromagnetic compatibility measurement; generic model; noisy environment; open area-test site; radiated electromagnetic interference; radiation emission data classification; statistical analysis; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic measurements; Electromagnetic modeling; Electromagnetic propagation; Electromagnetic radiation; Electronic equipment testing; Open area test sites; Transducers; Working environment noise; CISPR; Electromagnetic interference; ambient; emission; open areatest site (OATS); recursive termination;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio and Wireless Symposium, 2008 IEEE
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4244-1462-8
  • Type

    conf

  • DOI
    10.1109/RWS.2008.4463492
  • Filename
    4463492