DocumentCode :
3140841
Title :
An Algorithmic Pretest Development for Fault Identification in Analog Networks
Author :
Masurka, V.
Author_Institution :
Digital Equipment Corporation, Maynard, MA
fYear :
1981
fDate :
29-1 June 1981
Firstpage :
204
Lastpage :
212
Abstract :
This paper describes the design and development of an algorithm for fault identification in electrical analog networks. The emphasis is on mathematical formulation of the problem and generation of a viable fault identification criterion. The method serves as a pretest for a catastrophic (or considerably out-of-tolerance) fault condition. Under non-accessibility of some of the nodes, the method estimates nodal voltages to arrive at an estimated admittance matrix for the faulty Unit Under Test (UUT). The simulation of networks is done through Electronic Circuit Analysis Program (ECAP).
Keywords :
Admittance; Algorithm design and analysis; Analytical models; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Electronic circuits; Fault diagnosis; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1981. 18th Conference on
Type :
conf
DOI :
10.1109/DAC.1981.1585353
Filename :
1585353
Link To Document :
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