Title :
Diagnostic System for Large Scale Logic Cards and LSI´S
Author :
Goshima, Susumu ; Kozawa, Tokinori ; Oka, Yuichi ; Mori, Teruo ; Takeguch, Y. ; Ohno, Yasuhiero
Author_Institution :
Hitachi Research Laboratory Hitachi, Ltd., Ibaragi, Japan
Abstract :
We have developed the diagnostic system, consisting of highly automated test generator, fast fault simulator and automatic fault locator. Several techniques, employed in the system, are as follows: 9-value D-Algorithm for sequential circuits., 6-value concurrent fault simulator., Functional Modeling of RAM´S, ROM´S, counters, and etc., Iterative processing of generator and simulator. This system has contributed to testing cards, and LSI´S used in Hitachi computer M-200H and others.
Keywords :
Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Large scale integration; Large-scale systems; Logic; Sequential circuits; System testing;
Conference_Titel :
Design Automation, 1981. 18th Conference on
DOI :
10.1109/DAC.1981.1585360
