Title :
A miniature micro-machined millimeter-wave bandpass filter by CMOS compatible ICP deep-trench technology
Author :
Chang, Jin-Fa ; Lin, Yo-Sheng ; Chen, Chi-Chen ; Chen, Chang-Zhi ; Wang, Tao ; Lu, Shey-Shi
Author_Institution :
Nat. Chi Nan Univ., Puli
Abstract :
We demonstrate that miniature millimeter-wave (MMW) band-pass filter can be obtained by replacing the traditional eoplanar waveguide structures with the miniature lumped-spiral inductors and metal-insulator-metal (MIM) capacitors. To study the substrate effects on the performances of the spiral inductor and filter, CMOS-compatible backside inductively-coupled-plasma (ICP) deep trench technology was used to selectively remove the silicon underneath them. The results show that a 70.9% (from 5.8 to 9.91) and a 298.7% (from 2.33 to 9.29) increase in Q-factor were achieved at 40 GHz and 60 GHz, respectively, for a 251.7 pH inductor after the ICP etching. In addition, a 0.9 dB (from -5.4 dB to -4.6 dB) improvement in peak insertion loss (S23) was achieved for the miniature bandpass filter with 3-dB bandwidth of 47.7 GHz (18.4 ~ 66.1 GHz) after the ICP etching. The chip area of the miniature filter was only 206 mum x 106 mum excluding the test pads.
Keywords :
CMOS integrated circuits; MIM devices; MIMIC; band-pass filters; capacitors; coplanar waveguides; millimetre wave filters; CMOS compatible ICP deep-trench technology; MMW band-pass filter; Q-factor; coplanar waveguide structures; frequency 40 GHz; frequency 47.7 GHz; frequency 60 GHz; inductively-coupled-plasma deep trench technology; metal-insulator-metal capacitors; miniature lumped-spiral inductors; miniature micro-machined millimeter-wave bandpass filter; Band pass filters; CMOS technology; Etching; Inductors; MIM capacitors; Metal-insulator structures; Millimeter wave technology; Q factor; Silicon; Spirals; CMOS; MMW; Miniature; filter; micro-machined;
Conference_Titel :
Radio and Wireless Symposium, 2008 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-1462-8
Electronic_ISBN :
978-1-4244-1463-5
DOI :
10.1109/RWS.2008.4463513