Title :
New piezo-tunneling strain sensor with very low temperature sensitivity
Author :
Friedrich, A.P. ; Besse, P.A. ; Ashruf, C.M.A. ; Popovic, R.S.
Author_Institution :
Swiss Fed. Inst. of Technol., Lausanne, Switzerland
Abstract :
In this paper we present a new silicon piezo-tunneling strain sensor having a very low temperature dependence of the sensitivity. The new sensor is based on a lateral backward diode with a prevailing band-to-band tunneling current in its reverse-bias characteristic. At the operating bias, the temperature dependence of the tunneling current is shown to be small and of opposite sign to that of conventional piezoresistors. Furthermore, the change of sensitivity due to temperature is more than one order of magnitude lower than that of conventional piezoresistors, which makes the sensor almost temperature independent
Keywords :
elemental semiconductors; piezoresistive devices; silicon; strain measurement; strain sensors; tunnel diodes; tunnelling; Si; lateral backward diode; piezo-tunneling strain sensor; piezoresistors; prevailing band-to-band tunneling current; reverse-bias characteristic; sensitivity change; silicon piezo-tunneling strain sensor; temperature dependence; very low temperature sensitivity; Capacitive sensors; Current measurement; Diodes; Laser excitation; Sensor phenomena and characterization; Silicon; Strain measurement; Temperature dependence; Temperature sensors; Tunneling;
Conference_Titel :
Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-3829-4
DOI :
10.1109/SENSOR.1997.613600