• DocumentCode
    314140
  • Title

    Self-assembled microactuated XYZ stages for optical scanning and alignment

  • Author

    Fan, Li ; Wu, Ming C. ; Choquette, Kent D. ; Crawford, Mary H.

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
  • Volume
    1
  • fYear
    1997
  • fDate
    16-19 Jun 1997
  • Firstpage
    319
  • Abstract
    A novel self-assembled, surface-micromachined micro-XYZ stage with large displacements and fine positioning accuracy has been demonstrated on a Si microoptical bench for optical scanning/alignment applications. Continuous lateral scanning up to 120 μm and vertical scanning up to 250 μm have been achieved with integrated scratch drive actuators (SDA), which have step resolutions of 27 nm. The XYZ stage can be fully assembled by applying an electric bias only. Focus adjustment of the micro-Fresnel lens integrated on the micro-XYZ stage has also been successfully demonstrated. This is useful for two-dimensional scanning, dynamic focusing/tracking, and fine optical alignment
  • Keywords
    integrated optics; lenses; microactuators; micromachining; optical fabrication; optical focusing; optical scanners; optical tracking; optical workshop techniques; physical instrumentation control; position control; silicon; Focus adjustment; Si; Si microoptical bench; continuous lateral scanning; dynamic focusing/tracking; electric bias; fine optical alignment; fine positioning accuracy; integrated scratch drive actuators; large displacements; micro-Fresnel lens; optical alignment; optical scanning; self-assembled microactuated XYZ stages; step resolutions; surface-micromachined micro-XYZ stage; two-dimensional scanning; vertical scanning; Actuators; Assembly; Integrated optics; Lenses; Microactuators; Microoptics; Optical interconnections; Optical refraction; Optical sensors; Self-assembly;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-7803-3829-4
  • Type

    conf

  • DOI
    10.1109/SENSOR.1997.613648
  • Filename
    613648