Title :
Contactless angle measurement using four Hall devices on single chip
Author :
Metz, M. ; Häberli, A. ; Schneider, M. ; Steiner, R. ; Maier, C. ; Baltes, H.
Author_Institution :
Phys. Electron. Lab., Eidgenossische Tech. Hochschule, Zurich, Switzerland
Abstract :
A novel method for contactless angle detection is presented. It is based on four Hall devices on a single industrial CMOS chip in combination with a permanent magnet. The system setup and the Hall devices implemented are described. Measurements show an angular accuracy of ±0.3° over the range of 360°. We also measured the magnetic field distribution in the chip plane. Based on this, the robustness of the angular accuracy against mechanical tolerances is investigated. Lateral misalignment below 100 μm of the chip or the magnet to the axis of rotation causes an angle error below ±1°. A tilt of 1.5° between magnet and chip results in ±0.5°. A worst case combination of the three effects still results in an accuracy better than ±3.6
Keywords :
CMOS integrated circuits; Hall effect transducers; angular measurement; magnetic sensors; measurement errors; permanent magnets; 100 mum; Hall devices; angular accuracy; contactless angle detection; industrial CMOS chip; lateral misalignment; magnetic field distribution; mechanical tolerances; permanent magnet; robustness; Goniometers; Laboratories; Magnetic devices; Magnetic field measurement; Magnetic sensors; Mechanical sensors; Permanent magnets; Robustness; Semiconductor device measurement; Voltage;
Conference_Titel :
Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-3829-4
DOI :
10.1109/SENSOR.1997.613665