• DocumentCode
    3141506
  • Title

    High linear density in perpendicular recording

  • Author

    Guarisco, D. ; Nguy, H.

  • Author_Institution
    Maxtor Adv. Technol., Milpitas, CA, USA
  • fYear
    2003
  • fDate
    6-8 Jan. 2003
  • Firstpage
    7
  • Abstract
    In the never-ending quest for higher areal recording density, perpendicular recording is viewed as the most likely candidate to supplant longitudinal recording. However, currently perpendicular recording is lagging longitudinal recording in terms of areal density by almost a factor of two. It is generally believed that the lack of optimized perpendicular head and media is hindering the progress of perpendicular recording in spite of its theoretical advantages. Recently, so-called oxide perpendicular media have become available. In such media, the perpendicularly oriented magnetic grains are physically isolated, e.g., in a SiO/sub 2/ phase, thus ensuring magnetic decoupling between the grains. This paper compares the recording performance of conventional and oxide perpendicular media, showing that the latter hold the promise of bridging the gap to longitudinal recording.
  • Keywords
    discontinuous metallic thin films; magnetic heads; magnetic thin films; perpendicular magnetic recording; silicon compounds; SiO/sub 2/; SiO/sub 2/ isolating phase; areal recording density; longitudinal recording; magnetic decoupling; magnetic grain orientation; magnetic grain physical isolation; oxide perpendicular recording media; perpendicular head optimization; perpendicular magnetic recording high linear density; Bit error rate; Coercive force; Magnetic field measurement; Magnetic flux; Magnetic heads; Magnetic recording; Perpendicular magnetic recording; Saturation magnetization; Temperature measurement; Valves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Joint NAPMRC 2003. Digest of Technical Papers [Perpendicular Magnetic Recording Conference]
  • Conference_Location
    Monterey, CA, USA
  • Print_ISBN
    0-7803-7746-X
  • Type

    conf

  • DOI
    10.1109/NAPMRC.2003.1177011
  • Filename
    1177011