• DocumentCode
    3141767
  • Title

    Effects of surface abrasion and impurity levels on stress-induced Dauphine twinning in alpha quartz

  • Author

    Cocuzzi, David A. ; Laughner, James W.

  • Author_Institution
    Frequency Electron. Inc., Mitchel Field, NY, USA
  • fYear
    1989
  • fDate
    31 May-2 Jun 1989
  • Firstpage
    617
  • Lastpage
    622
  • Abstract
    Two crystals of synthetic quartz were suitably prepared to study the effects of abrasion flaws and impurity content on the levels of stress required to induce Dauphine twinning. Four sample lots representing three surface treatments and two impurity levels were studied. One lot, designated as a control, was prepared from a crystal of low purity. Two lots prepared from the same crystal were abraded on one face with SiC grinding media, one with 15-μ particles and the other with 50-μ particles. Two stages of stress-induced Dauphine twinning are observed, namely nucleation and switchover. Raw data was collected in the form of applied load as read from a strip chart recorder attached to the stressing device. Contact areas of the specimens were determined and stress levels were calculated. These were ranked from lowest to highest and the standard form of the Weibull model was used to plot the data. A Newman-Keuls range test was used to estimate the significance of the difference between mean twinning stresses for all groups for nucleation and switchover. Initial results indicate that surface flaws and impurity concentration affect the stress level /required for twin nucleation and are factors in determining switchover stresses
  • Keywords
    crystal resonators; quartz; twinning; Newman-Keuls range test; SiO2 crystals; Weibull model; alpha quartz; effects of abrasion flaws; impurity concentration; impurity levels; levels of stress; nucleation; stress-induced Dauphine twinning; surface abrasion; surface flaws; switchover; synthetic quartz; twin nucleation; Ceramics; Crystals; Educational institutions; Equations; Frequency; Impurities; Silicon carbide; Stress; Strips; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control, 1989., Proceedings of the 43rd Annual Symposium on
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/FREQ.1989.68923
  • Filename
    68923