DocumentCode :
3141785
Title :
Evaluation of magnetization process and magnetic interactions in the double-layered perpendicular magnetic recording media
Author :
Nakagawa, Sachiko ; Das, S.
Author_Institution :
Dept. ofPhysical Electron., Tokyo Inst. of Technol., Japan
fYear :
2003
fDate :
6-8 Jan. 2003
Firstpage :
19
Abstract :
Ferromagnetic Hall effect (FHE) measurement is effective in performing the simultaneous evaluation of a recording layer (RL) with a soft magnetic under layer (SUL), i.e. a double-layered (DL) perpendicular magnetic recording media. A Co-Cr-Ta-Pt(100nm)/Ni-Fe(50mn) thin film, deposited by a facing targets sputtering apparatus, was evaluated using FHE measurement. The manipulation of different FHE responses from the RL and SUL is useful in evaluating their magnetic properties and overcome the limitations confronted by conventional methods.
Keywords :
Hall effect; chromium alloys; cobalt alloys; ferromagnetic materials; iron alloys; magnetic multilayers; magnetic particles; magnetisation; magnetostatics; nickel alloys; perpendicular magnetic recording; platinum alloys; sputter deposition; tantalum alloys; 100 nm; 50 nm; CoCrTaPt-NiFe; FHE responses; Hall loops; Hall voltage; RL; SUL; double-layered perpendicular magnetic recording media; facing targets sputtering apparatus deposited thin films; ferromagnetic Hall effect measurement; magnetic particle magnetostatic interaction; magnetization curves; media magnetic properties; recording layers; recording media magnetization process/magnetic interactions; soft magnetic under layers; Hall effect; Kerr effect; Magnetic field measurement; Magnetization processes; Magnetostatics; Particle measurements; Performance evaluation; Perpendicular magnetic recording; Sputtering; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Joint NAPMRC 2003. Digest of Technical Papers [Perpendicular Magnetic Recording Conference]
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-7746-X
Type :
conf
DOI :
10.1109/NAPMRC.2003.1177023
Filename :
1177023
Link To Document :
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