DocumentCode :
314186
Title :
Fabrication and characterization of U-shaped beams for the determination of Young´s modulus modification due to Joule heating of polysilicon microstructures
Author :
Yang, E.H. ; Fujita, H.
Author_Institution :
Inst. of Ind. Sci., Tokyo Univ., Japan
Volume :
1
fYear :
1997
fDate :
16-19 Jun 1997
Firstpage :
603
Abstract :
The modification of Young´s modulus is determined before and after the Joule heating generated by a current passing through polysilicon microstructures. U-shaped overhanging polysilicon beams are specially designed and fabricated to prevent both the heat transfer to substrate and the deformation by thermal expansion. The Joule heating is performed to the beams by applying a current of 5-20 mA for 5-10 seconds. The measured resonant frequencies shift up or down after the Joule heating, which is due to the deflection change of beams. The modification of the Young´s modulus is very small, which means that material properties after the reshaping are not changed much
Keywords :
Young´s modulus; elastic moduli measurement; elemental semiconductors; micromechanical resonators; resistance heating; semiconductor technology; silicon; thermomechanical treatment; 5 to 10 s; 5 to 20 mA; Joule heating; Si; U-shaped beams; U-shaped overhanging polysilicon beams; Young´s modulus modification; applied current; deflection change; polysilicon beam fabrication; polysilicon microstructures; reshaping technology; resonant frequency shift; Annealing; Fabrication; Frequency measurement; Heat transfer; Heating; Microstructure; Plastics; Resonant frequency; Structural beams; Thermal expansion;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-3829-4
Type :
conf
DOI :
10.1109/SENSOR.1997.613723
Filename :
613723
Link To Document :
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