DocumentCode :
314205
Title :
High-yield wafer chuck for single-sided wet etching of MEMS structures
Author :
Brugger, J. ; Beljakovic, G. ; Despont, M. ; Biebuyck, H. ; de Rooij, N.F. ; Vettiger, P.
Author_Institution :
Zurich Res. Lab., IBM Res. Div., Switzerland
Volume :
1
fYear :
1997
fDate :
16-19 Jun 1997
Firstpage :
711
Abstract :
We describe a new O-ring setup for wet etching processes. The low-cost approach using siloxane-based sealing rings has been successful for the single-sided etching of silicon and silicon dioxide using a reduced volume of KOH and BHF, respectively. With this approach, the previously fabricated device elements on the reverse wafer side are not damaged. The etchant was heated by an infrared lamp. The achieved etch control allowed the fabrication of membranes only 5 μm thick with good accuracy using an etch stop layer
Keywords :
circuit optimisation; etching; integrated circuit yield; membranes; micromechanical devices; process control; seals (stoppers); 5 mum; BHF; HF; KOH; MEMS structures; O-ring setup; Si; SiO2; buffered hydrofluoric acid; etch control; etch stop layer; high-yield wafer chuck; infrared lamp heating; membrane fabrication; reduced volume; siloxane-based sealing rings; single-sided wet etching; Biomembranes; Fabrication; Infrared heating; Laboratories; Micromechanical devices; Seals; Structural rings; Temperature; Thermal stresses; Wet etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Sensors and Actuators, 1997. TRANSDUCERS '97 Chicago., 1997 International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-3829-4
Type :
conf
DOI :
10.1109/SENSOR.1997.613751
Filename :
613751
Link To Document :
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