DocumentCode :
3142184
Title :
Magnetic force microscopy measurements of skew angle dependencies in perpendicular media
Author :
Svedberg, E.B. ; Litvinov, D. ; Gustafson, R. ; Chang, C.H. ; Khizroev, S.
Author_Institution :
Seagate Res., Pittsburgh, PA, USA
fYear :
2003
fDate :
6-8 Jan. 2003
Firstpage :
38
Abstract :
Today, one of the most critical issues in implementing perpendicular recording is believed to be the excessive sensitivity of a typical perpendicular recording system to the skew angle. In perpendicular data storage, the recording is expected to be produced in the effective gap near the trailing edge of the main pole of a single pole head (SPH). In this paper, magnetic force microscopy (MFM) is utilized to study the skew angle effects in perpendicular media with a CoCr-based hard layer and a Permalloy soft underlayer.
Keywords :
Permalloy; magnetic force microscopy; magnetic heads; magnetic multilayers; perpendicular magnetic recording; soft magnetic materials; CoCr-based hard layers; FeNi; MFM; Permalloy soft underlayers; SPH trailing edge effective gap; magnetic force microscopy; magnetic recording heads; perpendicular media skew angle dependencies; perpendicular recording systems; single pole head main pole trailing edge; skew angle effects; Degradation; Force measurement; Goniometers; Linear approximation; Magnetic force microscopy; Magnetic forces; Magnetic heads; Magnetic recording; Memory; Perpendicular magnetic recording;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Joint NAPMRC 2003. Digest of Technical Papers [Perpendicular Magnetic Recording Conference]
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-7746-X
Type :
conf
DOI :
10.1109/NAPMRC.2003.1177042
Filename :
1177042
Link To Document :
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