Title :
Multilayer media:role of the exchange break layer and soft underlayer thicknesses
Author :
Takano, K. ; Min Xiao ; Hoa Do ; Faruque, S. ; Fullerton, E.E.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
Abstract :
The authors discuss work on the magnetic characterization and recording performance of Co/Pd multilayers deposited on various soft underlayer (SUL) and exchange break layer (EBL) structures. The dependence of various recording parametrics were measured as a function of the SUL and EBL thickness and the dimensions of the pole head were investigated. Significant issues behind the transition from dual layer to single layer perpendicular recording are also discussed.
Keywords :
cobalt; exchange interactions (electron); ferromagnetic materials; magnetic heads; magnetic multilayers; palladium; perpendicular magnetic recording; Co-Pd; Co/Pd multilayers; EBL structures; SUL structures; dual layer; exchange break layer; magnetic characterization; multilayer media; pole head; recording parametrics; recording performance; single layer perpendicular recording; soft underlayer thicknesses; thickness; Amorphous magnetic materials; Anisotropic magnetoresistance; Magnetic films; Magnetic multilayers; Magnetic separation; Nonhomogeneous media; Perpendicular magnetic recording; Signal to noise ratio; Thickness measurement; Writing;
Conference_Titel :
Joint NAPMRC 2003. Digest of Technical Papers [Perpendicular Magnetic Recording Conference]
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-7746-X
DOI :
10.1109/NAPMRC.2003.1177053
