Title :
Analysis and Comparison of Fault Simulation
Author :
Zhang, Yan ; Guan, Yong ; Wang, Guohui
Author_Institution :
Coll. of Inf. Eng., Capital Normal Univ., Beijing, China
Abstract :
With the development of VLSI, circuit Design for Testability has become the focus of attention. Fault diagnosis and detection VLSI has become an important part of the development of essential. This paper is based on DFT theory as background, introduced the concept of fault simulation. Then introduce several fault simulation algorithm. And they conducted a comparative analysis. This paper expounds fault simulation algorithms on the improvement and development direction.
Keywords :
VLSI; design for testability; digital integrated circuits; failure analysis; fault simulation; integrated circuit design; DFT; VLSI; circuit simulation; comparative analysis; design for testability; digital circuits; fault simulation algorithm; Analytical models; Circuit faults; Circuit simulation; Circuit synthesis; Circuit testing; Design for testability; Electrical fault detection; Fault detection; Fault diagnosis; Very large scale integration; design for testability; digital circuit; fault simulation; fault simulator;
Conference_Titel :
Intelligent Ubiquitous Computing and Education, 2009 International Symposium on
Conference_Location :
Chengdu
Print_ISBN :
978-0-7695-3619-4
DOI :
10.1109/IUCE.2009.15
