DocumentCode
3142513
Title
Resonant soft x-ray scattering from magnetic thin films
Author
Fullerton, E.E. ; Hellwig, O. ; Kevan, S. ; Sorensen, L.B. ; Kortright, J.B.
Author_Institution
IBM Almaden Res. Center, San Jose, CA, USA
fYear
2003
fDate
6-8 Jan. 2003
Firstpage
54
Abstract
We have applied resonant SAS to characterize the chemical and magnetic heterogeneity of Co-based multilayers as well as CoPtCr-based perpendicular and longitudinal media. Separation of the chemical vs. magnetic heterogeneity is achieved by tuning the x-ray energy to both the Co and Cr edges.
Keywords
X-ray scattering; chromium alloys; cobalt; cobalt alloys; ferromagnetic materials; magnetic multilayers; magnetic recording; magnetic thin films; perpendicular magnetic recording; platinum alloys; stoichiometry; Co; Co-based multilayers; CoPtCr; CoPtCr-based perpendicular media; chemical heterogeneity; longitudinal media; magnetic heterogeneity; magnetic thin films; resonant SAS; resonant soft x-ray scattering; x-ray energy; Chemical elements; Chromium; Magnetic cores; Magnetic films; Magnetic force microscopy; Magnetic resonance; Magnetic separation; Materials science and technology; Resonance light scattering; X-ray scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Joint NAPMRC 2003. Digest of Technical Papers [Perpendicular Magnetic Recording Conference]
Conference_Location
Monterey, CA, USA
Print_ISBN
0-7803-7746-X
Type
conf
DOI
10.1109/NAPMRC.2003.1177058
Filename
1177058
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