Title :
Resonant soft x-ray scattering from magnetic thin films
Author :
Fullerton, E.E. ; Hellwig, O. ; Kevan, S. ; Sorensen, L.B. ; Kortright, J.B.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
Abstract :
We have applied resonant SAS to characterize the chemical and magnetic heterogeneity of Co-based multilayers as well as CoPtCr-based perpendicular and longitudinal media. Separation of the chemical vs. magnetic heterogeneity is achieved by tuning the x-ray energy to both the Co and Cr edges.
Keywords :
X-ray scattering; chromium alloys; cobalt; cobalt alloys; ferromagnetic materials; magnetic multilayers; magnetic recording; magnetic thin films; perpendicular magnetic recording; platinum alloys; stoichiometry; Co; Co-based multilayers; CoPtCr; CoPtCr-based perpendicular media; chemical heterogeneity; longitudinal media; magnetic heterogeneity; magnetic thin films; resonant SAS; resonant soft x-ray scattering; x-ray energy; Chemical elements; Chromium; Magnetic cores; Magnetic films; Magnetic force microscopy; Magnetic resonance; Magnetic separation; Materials science and technology; Resonance light scattering; X-ray scattering;
Conference_Titel :
Joint NAPMRC 2003. Digest of Technical Papers [Perpendicular Magnetic Recording Conference]
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-7746-X
DOI :
10.1109/NAPMRC.2003.1177058
