Investigations of the diagnosibility of digital networks with BIST

Author

Ubar, Raimund ; Kostin, Sergei ; Raik, Jaan

Author_Institution

Dept. of Comput. Eng., TTU, Tallinn

fYear

2009

fDate

2-5 March 2009

Firstpage

1

Lastpage

6

Abstract

The problem of embedded fault diagnosis in digital systems based on Built-In Self-Test (BIST) facilities is discussed. A conception for diagnosis of digital circuits, which does not use fault models, and methods for calculating the diagnosibility of the given circuit are presented. The proposed measures of diagnosibility can be used for redesign of the circuit to improve the exactness of locating the faults or faulty regions in digital circuits. Experimental results provide the data which characterize the diagnosibility of circuits for the ISCAS benchmark family.

Keywords

built-in self test; digital integrated circuits; fault diagnosis; integrated circuit testing; maintenance engineering; built-in self-test; diagnosibility; digital circuits diagnosis; digital networks; embedded fault diagnosis; Algorithm design and analysis; Built-in self-test; Circuit faults; Dictionaries; Digital circuits; Digital systems; Failure analysis; Fault diagnosis; Integrated circuit yield; Manufacturing; BIST; diagnosibility; digital networks; fault diagnosis;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Workshop, 2009. LATW '09. 10th Latin American

Conference_Location

Buzios, Rio de Janeiro

Print_ISBN

978-1-4244-4207-2

Electronic_ISBN

978-1-4244-4206-5

Type

conf

DOI

10.1109/LATW.2009.4813806

Filename

4813806