DocumentCode
3143056
Title
Design for Testability
Author
Williams, T.W.
Author_Institution
IBM Corporation, Boulder, CO
fYear
1982
fDate
14-16 June 1982
Firstpage
9
Lastpage
9
Abstract
This presentation will discuss the basics of design for testability. A short review of testing is given along with some reasons why one should test. The different techniques of design for testability are discussed in detail. These include techniques which can be applied to today´s technologies and techniques which have been recently introduced and will soon appear in new designs. These techniques include the three main areas of Design for Testability, 1) Ad Hoc approaches; 2) Structured approaches; and, 3) Self Test/Built-in Test approaches.
Keywords
Automatic testing; Built-in self-test; Design automation; Design for testability; Logic testing; Nails;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1982. 19th Conference on
Conference_Location
Las Vegas, NV, USA
ISSN
0146-7123
Print_ISBN
0-89791-020-6
Type
conf
DOI
10.1109/DAC.1982.1585472
Filename
1585472
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