• DocumentCode
    3143056
  • Title

    Design for Testability

  • Author

    Williams, T.W.

  • Author_Institution
    IBM Corporation, Boulder, CO
  • fYear
    1982
  • fDate
    14-16 June 1982
  • Firstpage
    9
  • Lastpage
    9
  • Abstract
    This presentation will discuss the basics of design for testability. A short review of testing is given along with some reasons why one should test. The different techniques of design for testability are discussed in detail. These include techniques which can be applied to today´s technologies and techniques which have been recently introduced and will soon appear in new designs. These techniques include the three main areas of Design for Testability, 1) Ad Hoc approaches; 2) Structured approaches; and, 3) Self Test/Built-in Test approaches.
  • Keywords
    Automatic testing; Built-in self-test; Design automation; Design for testability; Logic testing; Nails;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1982. 19th Conference on
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0146-7123
  • Print_ISBN
    0-89791-020-6
  • Type

    conf

  • DOI
    10.1109/DAC.1982.1585472
  • Filename
    1585472