DocumentCode :
3143056
Title :
Design for Testability
Author :
Williams, T.W.
Author_Institution :
IBM Corporation, Boulder, CO
fYear :
1982
fDate :
14-16 June 1982
Firstpage :
9
Lastpage :
9
Abstract :
This presentation will discuss the basics of design for testability. A short review of testing is given along with some reasons why one should test. The different techniques of design for testability are discussed in detail. These include techniques which can be applied to today´s technologies and techniques which have been recently introduced and will soon appear in new designs. These techniques include the three main areas of Design for Testability, 1) Ad Hoc approaches; 2) Structured approaches; and, 3) Self Test/Built-in Test approaches.
Keywords :
Automatic testing; Built-in self-test; Design automation; Design for testability; Logic testing; Nails;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1982. 19th Conference on
Conference_Location :
Las Vegas, NV, USA
ISSN :
0146-7123
Print_ISBN :
0-89791-020-6
Type :
conf
DOI :
10.1109/DAC.1982.1585472
Filename :
1585472
Link To Document :
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