DocumentCode
3143353
Title
A simulation comparison of time-hopping PAM and interference suppressing OFDM in multiuser ultra wideband communications systems
Author
Popescu, Dimitrie C. ; Yaddanapudi, Prasad ; Vallepalli, Naresha ; Raju, G.V.S.
Author_Institution
Old Dominion Univ., Norfolk
fYear
2008
fDate
22-24 Jan. 2008
Firstpage
875
Lastpage
878
Abstract
In this paper we present a side-by-side comparison between time-hopping (TH) impulse radios (IR) based on pulse amplitude modulation (PAM) and interference suppressing (IS) OFDM-based ultra wideband (UWB) systems in multi-user scenarios. For both systems we use minimum mean squared error (MMSE) receivers, and look at the raw bit error rate (BER) at the physical layer as performance criterion. This is evaluated using simulations for various scenarios that include additive white Gaussian noise (AWGN), multipath and/or multiple access interference, and narrowband interference. Numerical results indicate that in the presence of AWGN only, the two systems display similar performance, while for multipath propagation the TH-PAM IR system outperforms the IS-OFDM system. However, in the presence of narrowband interference the IS-OFDM system outperforms the TH-PAM IR system which displays poor performance in this case.
Keywords
AWGN channels; OFDM modulation; error statistics; interference suppression; mean square error methods; multipath channels; multiuser channels; pulse amplitude modulation; ultra wideband communication; AWGN; MMSE receiver; additive white Gaussian noise; bit error rate; impulse radio; interference suppressing OFDM; minimum mean squared error; multipath propagation; multiple access interference; narrowband interference; pulse amplitude modulation; simulation; time-hopping PAM; ultra wideband communications system; AWGN; Amplitude modulation; Bit error rate; Displays; Interference suppression; Narrowband; OFDM; Pulse modulation; Ultra wideband communication; Ultra wideband technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Radio and Wireless Symposium, 2008 IEEE
Conference_Location
Orlando, FL
Print_ISBN
978-1-4244-1462-8
Electronic_ISBN
978-1-4244-1463-5
Type
conf
DOI
10.1109/RWS.2008.4463632
Filename
4463632
Link To Document