Title :
A smoothness index based approach for off-line signature verification
Author :
Fang, B. ; Wang, Y.Y. ; Leung, C.H. ; Tang, Y.Y. ; Kwok, P.C.K. ; Tse, K.W. ; Wong, Y.K.
Author_Institution :
Dept. of Electr. & Electron. Eng., Hong Kong Univ., Hong Kong
Abstract :
Proposes a method to tackle the problem of detecting skilled forgeries in off-line signature verification. Inspired by the approach adopted by expert examiners, it is based on a smoothness criterion. From a collection of genuine and forged signatures, it is observed that, although skilled forgery signatures are very similar to genuine ones on a global scale, they are generally less smooth and natural on a detailed scale than the genuine ones, especially for those skilled forgery signatures which consist of cursive graphic patterns. A smoothness index is derived from such signatures. This is combined with other global shape features and used for verification. Satisfactory results are obtained
Keywords :
handwriting recognition; cursive graphic patterns; detailed scale; global shape features; off-line signature verification; skilled forgery detection; smoothness criterion; smoothness index; Acceleration; Computer science; Data mining; Electronic switching systems; Feature extraction; Forgery; Graphics; Handwriting recognition; Network address translation; Read only memory;
Conference_Titel :
Document Analysis and Recognition, 1999. ICDAR '99. Proceedings of the Fifth International Conference on
Conference_Location :
Bangalore
Print_ISBN :
0-7695-0318-7
DOI :
10.1109/ICDAR.1999.791905