DocumentCode :
3143656
Title :
Effects of various applications on relative lifetime of processor cores
Author :
Gupta, T. ; Bertolini, C. ; Heron, O. ; Ventroux, N. ; Zimmer, T. ; Marc, F.
Author_Institution :
LIST, CEA, Gif-sur-Yvette, France
fYear :
2009
fDate :
18-22 Oct. 2009
Firstpage :
132
Lastpage :
135
Abstract :
The lifetime of integrated chip tends to decrease more and more with technology scaling. To check if a design is robust, in this paper we present RTME (real time MTTF evaluation), a simulation framework that enables the evaluation of reliability at higher level of abstraction layer. Using the output of RTME, we are able to distinguish the effect of different benchmarks on different blocks of the processor.
Keywords :
microprocessor chips; RTME; integrated chip lifetime; processor block; processor cores; real time MTTF evaluation; reliability evaluation; technology scaling; Aging; Circuit simulation; Degradation; Electromigration; Electrons; Failure analysis; Hot carrier injection; Human computer interaction; Niobium compounds; Titanium compounds; Digital circuits; Power Consumption; Processor; Reliability; Simulation; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report, 2009. IRW '09. IEEE International
Conference_Location :
S. Lake Tahoe, CA
ISSN :
1930-8841
Print_ISBN :
978-1-4244-3921-8
Electronic_ISBN :
1930-8841
Type :
conf
DOI :
10.1109/IRWS.2009.5383013
Filename :
5383013
Link To Document :
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