DocumentCode :
3143867
Title :
Entropy-based Criteria Dealing with the Ties Problem in Gene Selection
Author :
Yang, Feng ; Mao, K.Z.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2009
fDate :
1-3 June 2009
Firstpage :
124
Lastpage :
129
Abstract :
Gene selection is one of the major issues in microarray gene expression data analysis. Among existing gene selection techniques, wrapper methods usually produce better selection results than filter methods and embedded methods. The wrapper methods employ a predefined classification algorithm and evaluate the goodness of gene subsets in terms of classification error, which is usually obtained through error counting. Due to the high dimensionality and small sample size of gene expression data, counting-based evaluation criteria could result in severe ties problem which induces selection uncertainty and poor robustness. In this study, we will demonstrate the existence of the ties problem by well designed experiments. In addition, two continuous evaluation criteria based on Renyipsilas entropy and support vector machines (SVMs) were proposed. Experiment results show that the proposed SVM-Renyipsilas entropy criteria could well overcome the ties problem and provide gene subsets leading to improved classification accuracy.
Keywords :
biology computing; data analysis; entropy; genetics; pattern classification; support vector machines; Renyi entropy; classification accuracy; classification error; counting-based evaluation criteria; embedded methods; entropy-based criteria dealing; filter methods; gene selection techniques; microarray gene expression data analysis; predefined classification algorithm; support vector machines; ties problem; wrapper methods; Bioinformatics; Classification algorithms; Data analysis; Data engineering; Entropy; Filters; Gene expression; Information science; Neoplasms; Pattern recognition; Feature selection; gene expression data analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer and Information Science, 2009. ICIS 2009. Eighth IEEE/ACIS International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3641-5
Type :
conf
DOI :
10.1109/ICIS.2009.98
Filename :
5223103
Link To Document :
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