Title :
Database structure and discovery tools for integrated circuit reliability evaluation
Author_Institution :
SGS-Thomson Microelectron., Cornaredo, Italy
Abstract :
The reliability performance of integrated circuits is described by means of a large amount of quantitative and qualitative data that require computer tools for effective management. The author describes some design solutions in the implementation of these tools, in particular stressing the integration of different points of view to model reliability performance; the structure of the failure database that, following expert reasoning features, implicitly contains as cause-effect relationships the results of the failure analysis; and the procedures designed to discover regularities and relationships among stored data, thus helping engineers in reliability evaluation and failure analysis
Keywords :
circuit reliability; deductive databases; electronic engineering computing; inference mechanisms; integrated circuit technology; knowledge based systems; software tools; cause-effect relationships; computer tools; discovery tools; expert reasoning; failure analysis; failure database; integrated circuit reliability; reliability performance; Application specific integrated circuits; Databases; Electric variables measurement; Failure analysis; Integrated circuit modeling; Integrated circuit reliability; Laboratories; Life estimation; Stress; Testing;
Conference_Titel :
Data Engineering, 1992. Proceedings. Eighth International Conference on
Conference_Location :
Tempe, AZ
Print_ISBN :
0-8186-2545-7
DOI :
10.1109/ICDE.1992.213195
