Reassessing NBTI mechanisms by ultrafast charge pumping measurement

We reassess NBTI mechanisms by an UFCP method and show that the abrupt change of ¿I_cp at stress/recovery transition (and vice versa) is due to a stressed induced oxide trap current. Thus, the current claim of fast generation/recovery of ¿N_it has to be reviewed. Moreover, stress induced interface traps, ¿N_it (the component of ¿I_cp which is independent of pulse width) is permanent, i.e. do not recover. This observation also does not conform to the notion that generation/recovery of ¿N_it is limited by the transport of hydrogen species.