DocumentCode :
3144298
Title :
Reliability in the more than moore landscape
Author :
Schmitz, John
Author_Institution :
Vice President Process Technology Research, NXP Semiconductor, USA
fYear :
2009
fDate :
18-22 Oct. 2009
Abstract :
The semiconductor industry is not only involved in the economical turmoil but has at the same time to deal with some steep technological barriers as well as challenging society demands in the fields of for example health, energy, security and privacy. However, it is exactly these societal trends that bring huge opportunities to the industry. To name a few: power management in hybrid cars, smart power management in homes and buildings, photo-voltaic electricity, secure data transfer, bio-metric data protection, bio electronic diagnostic devices, e-pill and so on.
Keywords :
CMOS technology; Data security; Electronics industry; Energy management; Environmental economics; Hybrid electric vehicles; Integrated circuit reliability; Power generation economics; Privacy; Semiconductor device reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report, 2009. IRW '09. IEEE International
Conference_Location :
South Lake Tahoe, CA, USA
ISSN :
1930-8841
Print_ISBN :
978-1-4244-3921-8
Electronic_ISBN :
1930-8841
Type :
conf
DOI :
10.1109/IRWS.2009.5383045
Filename :
5383045
Link To Document :
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