DocumentCode
3144298
Title
Reliability in the more than moore landscape
Author
Schmitz, John
Author_Institution
Vice President Process Technology Research, NXP Semiconductor, USA
fYear
2009
fDate
18-22 Oct. 2009
Abstract
The semiconductor industry is not only involved in the economical turmoil but has at the same time to deal with some steep technological barriers as well as challenging society demands in the fields of for example health, energy, security and privacy. However, it is exactly these societal trends that bring huge opportunities to the industry. To name a few: power management in hybrid cars, smart power management in homes and buildings, photo-voltaic electricity, secure data transfer, bio-metric data protection, bio electronic diagnostic devices, e-pill and so on.
Keywords
CMOS technology; Data security; Electronics industry; Energy management; Environmental economics; Hybrid electric vehicles; Integrated circuit reliability; Power generation economics; Privacy; Semiconductor device reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop Final Report, 2009. IRW '09. IEEE International
Conference_Location
South Lake Tahoe, CA, USA
ISSN
1930-8841
Print_ISBN
978-1-4244-3921-8
Electronic_ISBN
1930-8841
Type
conf
DOI
10.1109/IRWS.2009.5383045
Filename
5383045
Link To Document