Abstract :
The following topics are dealt with: integrated circuit reliability; memory circuit; negative bias temperature instability; transistor; and wafer level reliability.
Keywords :
integrated circuit reliability; storage management chips; transistors; integrated circuit reliability; memory circuit; negative bias temperature instability; transistor; wafer level reliability;
Conference_Titel :
Integrated Reliability Workshop Final Report, 2009. IRW '09. IEEE International
Conference_Location :
S. Lake Tahoe, CA
Print_ISBN :
978-1-4244-3921-8
DOI :
10.1109/IRWS.2009.5383048
