• DocumentCode
    3144494
  • Title

    >300GHz fixed-frequency and voltage-controlled fundamental oscillators in an InP DHBT process

  • Author

    Seo, Munkyo ; Urteaga, Miguel ; Young, Adam ; Jain, Vibhor ; Griffith, Zach ; Hacker, Jonathan ; Rowell, Petra ; Pierson, Richard ; Rodwell, M.

  • Author_Institution
    Teledyne Sci. & Imaging, Thousand Oaks, CA, USA
  • fYear
    2010
  • fDate
    23-28 May 2010
  • Firstpage
    272
  • Lastpage
    275
  • Abstract
    We report fundamental fixed-frequency and voltage-controlled oscillators operating at >300 GHz fabricated in a 256 nm InP DHBT technology. Oscillator designs are based on a differential series-tuned topology followed by a common-base buffer. Measured oscillation frequencies of fixed-frequency designs are 267.4, 286.8, 310.2, and 346.2 GHz, at PDC = 35 mW. At optimum bias, the output power was measured to be -5.1, -6.9, -9.2, and -11.0 dBm for each design (no probe loss correction), with PDC ≤ 115 mW. Measured phase noise was -96.6 dBc/Hz at 10 MHz offset. Varactor-tuned designs demonstrated 10.6-12.3 GHz of tuning bandwidth.
  • Keywords
    heterojunction bipolar transistors; indium compounds; millimetre wave bipolar transistors; millimetre wave oscillators; phase noise; submillimetre wave oscillators; voltage-controlled oscillators; InP; InP DHBT technology; bandwidth 10.6 GHz to 12.3 GHz; common-base buffer; differential series-tuned topology; fixed-frequency oscillators; frequency 267.4 GHz; frequency 286.8 GHz; frequency 310.2 GHz; frequency 346.2 GHz; phase noise; power 35 mW; size 256 nm; varactor-tuned designs; voltage-controlled fundamental oscillators; Frequency measurement; Indium phosphide; Loss measurement; Noise measurement; Phase measurement; Power generation; Power measurement; Probes; Topology; Voltage-controlled oscillators; MMIC oscillators; Millimeter-wave oscillators; voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-6056-4
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2010.5517660
  • Filename
    5517660