Title :
Programs for Verifying Circuit Connectivity of MOS/LSI Mask Artwork
Author :
Takashima, Makoto ; Mitsuhashi, Takashi ; Chiba, Toshiaki ; Yoshida, Kenji
Author_Institution :
Toshiba Corporation, Kawasaki, Japan
Abstract :
This paper describes three programs which perform connectivity rule check, logic gate recognition for logic simulation and circuit connectivity comparison. These programs have been developed for verifying circuit connectivity extracted from mask artwork. Powerful algorithms are used in these programs, including a heuristic graph comparison algorithm, to realize highly practical verification aids. Through the combined use of these programs, more cost-effective verification is possible.
Keywords :
Circuit analysis; Circuit simulation; Data mining; Design methodology; Heuristic algorithms; Large scale integration; Logic circuits; Logic gates; Switches; Switching circuits;
Conference_Titel :
Design Automation, 1982. 19th Conference on
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-89791-020-6
DOI :
10.1109/DAC.1982.1585551