Title :
Investigation of different wavelets for pulse shape discrimination of LSO and LuYAP scintillators in positron emission tomography
Author :
Arafa, A.A. ; Saleh, H.I. ; Ashour, M. ; Salem, A.
Author_Institution :
Radiat. Eng. Dept., NCRRT, Cairo, Egypt
Abstract :
A way to get the depth of interaction (DOI) information in a positron emission tomography (PET) scanner is the use of phoswich detectors. The layer of interaction is identified from the pulse shape of the corresponding scintillator material. In this work, wavelets based pulse shape discrimination (PSD) were investigated in order to find a best practical wavelets family of distinguishing two different pulses types recorded from LSO and LuYAP crystals. The wavelets based PSD gain high performance ranges from 99.75 to 99.26. On the other hand, the best compromise between performance and Discrete wavelet transform (DWT) decomposition level and execution time turned out that Dubechies 6 (db6) gives 99.63% successful discrimination rate at level 1 and consuming 12.828 sec over 10 000 pulses.
Keywords :
biomedical equipment; positron emission tomography; signal processing; solid scintillation detectors; wavelet transforms; DOI information; LSO crystal; LSO scintillator; LuYAP crystal; LuYAP scintillator; PET scanner; depth of interaction; discrete wavelet transform decomposition; phoswich detectors; positron emission tomography; scintillator material pulse shape; wavelet based pulse shape discrimination; Crystalline materials; Crystals; Discrete wavelet transforms; Optical pulse shaping; Photomultipliers; Positron emission tomography; Power engineering and energy; Pulse shaping methods; Shape; Solid scintillation detectors; Crystal Identification; DOI; DWT; PET; PSD;
Conference_Titel :
Computer Engineering & Systems, 2009. ICCES 2009. International Conference on
Conference_Location :
Cairo
Print_ISBN :
978-1-4244-5842-4
Electronic_ISBN :
978-1-4244-5843-1
DOI :
10.1109/ICCES.2009.5383058
