DocumentCode
3144738
Title
Adaptive digital pre-distortions based on affine projection algorithm for WCDMA power amplifier applications
Author
Chun, Sang-Hyun ; Kim, Young-Ho ; Choi, Kyu-Jin ; Kim, Ji-Yeon ; Kim, Jong-Heon ; Kim, Dongsu ; Hahn, Cheol-Koo
Author_Institution
Dept. of Wireless Commun. Eng., Kwangwoon Univ., Seoul, South Korea
fYear
2010
fDate
23-28 May 2010
Firstpage
1094
Lastpage
1097
Abstract
In this paper, we propose an adaptive digital pre-distortion (DPD) linearization based on an affine projection (AP) algorithm for WCDMA power amplifier applications. The performance of the affine projection algorithm is compared with the least-mean-square (LMS) algorithm and recursive-least-square (RLS) algorithm, respectively. From the compared results, the AP algorithm has the advantage of more efficient computational complexity than the other algorithms and also the convergence speed of the AP algorithm is faster than that of the LMS algorithm. An affine projection algorithm based DPD has been simulated and compared with a DPD using LMS and RLS algorithms, respectively. From the simulation results, the AP based DPD has achieved -62.5 dBc adjacent channel leakage ratio (ACLR) at the average output power of 44.7 dBm of power amplifier for WCDMA 1-FA test signal.
Keywords
code division multiple access; computational complexity; least mean squares methods; power amplifiers; WCDMA; adaptive digital pre-distortion linearization; adaptive digital pre-distortions; adjacent channel leakage ratio; affine projection algorithm; computational complexity; least-mean-square algorithm; power amplifier applications; recursive-least-square algorithm; Computational complexity; Computational modeling; Convergence; Least squares approximation; Multiaccess communication; Power amplifiers; Power generation; Projection algorithms; Resonance light scattering; Testing; Adaptive Digital Pre-distortion; Affine Projection Algorithm; Linearization;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location
Anaheim, CA
ISSN
0149-645X
Print_ISBN
978-1-4244-6056-4
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2010.5517672
Filename
5517672
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