DocumentCode :
3144738
Title :
Adaptive digital pre-distortions based on affine projection algorithm for WCDMA power amplifier applications
Author :
Chun, Sang-Hyun ; Kim, Young-Ho ; Choi, Kyu-Jin ; Kim, Ji-Yeon ; Kim, Jong-Heon ; Kim, Dongsu ; Hahn, Cheol-Koo
Author_Institution :
Dept. of Wireless Commun. Eng., Kwangwoon Univ., Seoul, South Korea
fYear :
2010
fDate :
23-28 May 2010
Firstpage :
1094
Lastpage :
1097
Abstract :
In this paper, we propose an adaptive digital pre-distortion (DPD) linearization based on an affine projection (AP) algorithm for WCDMA power amplifier applications. The performance of the affine projection algorithm is compared with the least-mean-square (LMS) algorithm and recursive-least-square (RLS) algorithm, respectively. From the compared results, the AP algorithm has the advantage of more efficient computational complexity than the other algorithms and also the convergence speed of the AP algorithm is faster than that of the LMS algorithm. An affine projection algorithm based DPD has been simulated and compared with a DPD using LMS and RLS algorithms, respectively. From the simulation results, the AP based DPD has achieved -62.5 dBc adjacent channel leakage ratio (ACLR) at the average output power of 44.7 dBm of power amplifier for WCDMA 1-FA test signal.
Keywords :
code division multiple access; computational complexity; least mean squares methods; power amplifiers; WCDMA; adaptive digital pre-distortion linearization; adaptive digital pre-distortions; adjacent channel leakage ratio; affine projection algorithm; computational complexity; least-mean-square algorithm; power amplifier applications; recursive-least-square algorithm; Computational complexity; Computational modeling; Convergence; Least squares approximation; Multiaccess communication; Power amplifiers; Power generation; Projection algorithms; Resonance light scattering; Testing; Adaptive Digital Pre-distortion; Affine Projection Algorithm; Linearization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2010.5517672
Filename :
5517672
Link To Document :
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