DocumentCode :
3144937
Title :
Optimization of reflow-thermal profile by design of experiments with response surface methodology for minimizing solder-ball defects
Author :
Chansa-ngavej, Chuvej ; Kasemsomporn, Jumroon
Author_Institution :
Sch. of Manage., Shinawatra Univ. (SIU), Bangkok
fYear :
2008
fDate :
21-24 Sept. 2008
Firstpage :
412
Lastpage :
417
Abstract :
Electronics-assembly companies are always trying to reduce solder-ball defects as their customers keep tightening specification since the solder balls could cause electrical short circuit and damage to the product. The effect of solder ball defects is not only on quality risk, but also on scrap costs. Consequently, electronics-assembly companies need to keep focusing on minimizing this type of defects. One initiative to overcome this problem is to minimize the spattering of solder while the product is passing through reflow-soldering oven. Reflow soldering is a complex process, which requires specific optimal soldering conditions based on experimental data. The trial-and-error method to determine the optimal conditions would require a prohibitively large number of experiments, however, and so the Response Surface Methodology (RSM) has been employed in this research to overcome this problem.
Keywords :
assembling; design of experiments; electronics industry; optimisation; response surface methodology; soldering; soldering equipment; design of experiments; electronics-assembly companies; reflow-thermal optimization; response surface methodology; solder-ball defects; trial-and-error method; Circuits; Conducting materials; Costs; Design optimization; Medical services; Ovens; Production; Raw materials; Reflow soldering; Response surface methodology; Response Surface Methodology; process optimization; reflow-thermal profile; solder-ball defects;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Management of Innovation and Technology, 2008. ICMIT 2008. 4th IEEE International Conference on
Conference_Location :
Bangkok
Print_ISBN :
978-1-4244-2329-3
Electronic_ISBN :
978-1-4244-2330-9
Type :
conf
DOI :
10.1109/ICMIT.2008.4654400
Filename :
4654400
Link To Document :
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