Title :
A Design System Approach to Data Integrity
Author :
Noon, William A. ; Robbins, Ken N. ; Roberts, M. Ted
Author_Institution :
International Business Machines Corporation, Kingston, NY
Abstract :
Due to the nature of chip design, the Very Large-Scale Integrated (VLSI) design data base is constantly changing. The changes may be caused by logical or physical design activities. In either case, there is a need to make sure that no matter what happens, the data base remains valid. This paper discusses a system which uses an AUtomated Data Integrity Technique (AUDIT) to eliminate errors prior to hardware build.
Keywords :
Application specific integrated circuits; Chip scale packaging; Control systems; Design automation; Error correction; Humans; Job design; Logic design; Very large scale integration;
Conference_Titel :
Design Automation, 1982. 19th Conference on
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-89791-020-6
DOI :
10.1109/DAC.1982.1585572