DocumentCode :
3145136
Title :
An on-chip hot pixel identification and correction approach in CMOS imagers
Author :
Cao, Yuan ; Zhang, Xiangyu
Author_Institution :
EEE Dept., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2011
fDate :
17-18 Nov. 2011
Firstpage :
408
Lastpage :
411
Abstract :
The appearance of hot pixels significantly degrades the image qualities over the image sensor lifetime. In this paper, a robust readout circuitry is proposed to on-chip detect and mask the hot pixels in image sensors. Conventionally, hot pixels modeled as salt and pepper noise are corrected by an low pass filter which is applied to the entire image. However, this results the loss of overall image sharpness. The proposed approach provides the exact hot pixel positions before correction. It does not require extra non-volatile memory to store the map of the hot pixels. In addition, this method allows identification of new hot pixels generated during the sensor lifetime.
Keywords :
CMOS image sensors; image denoising; low-pass filters; readout electronics; reliability; system-on-chip; CMOS imagers; image quality; image sensor lifetime; image sharpness; low pass filter; on-chip hot pixel correction; on-chip hot pixel identification; robust readout circuitry; salt and pepper noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SoC Design Conference (ISOCC), 2011 International
Conference_Location :
Jeju
Print_ISBN :
978-1-4577-0709-4
Electronic_ISBN :
978-1-4577-0710-0
Type :
conf
DOI :
10.1109/ISOCC.2011.6138618
Filename :
6138618
Link To Document :
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