Title :
A ring-VCO-based injection-locked frequency multiplier using a new pulse generation technique in 65 nm CMOS
Author :
Kanemaru, Norifumi ; Ikeda, Sho ; Kamimura, Tatsuya ; Sang-yeop Lee ; Tanoi, Satoru ; Ito, Hiroyuki ; Ishihara, Noboru ; Masu, Kazuya
Author_Institution :
Solutions Res. Lab., Tokyo Inst. of Technol., Yokohama, Japan
Abstract :
This paper proposes a low-phase-noise ring-VCO-based frequency multiplier with a new subharmonic direct injection locking technique that only uses a time-delay cell and four MOS transistors. Since the proposed technique behaves as an exclusive OR and can double the reference signal frequency, it increases phase correction points and achieves low phase noise characteristic across the wide output frequency range. The frequency multiplier was fabricated by using 65 nm Si CMOS process. Measured 1-MHz-offset phase noise at 6.34 GHz with reference signals of 528 MHz was -113dBc/Hz.
Keywords :
CMOS integrated circuits; MOSFET; frequency multipliers; injection locked oscillators; pulse generators; voltage-controlled oscillators; CMOS; MOS transistors; frequency 528 MHz; frequency 6.34 GHz; low phase noise ring VCO-based frequency multiplier; phase correction points; pulse generation technique; reference signal frequency; ring-VCO-based injection-locked frequency multiplier; size 65 nm; subharmonic direct injection locking; time-delay cell; CMOS; Injection locked frequency multiplier; pulse injection; ring VCO;
Conference_Titel :
SoC Design Conference (ISOCC), 2011 International
Conference_Location :
Jeju
Print_ISBN :
978-1-4577-0709-4
Electronic_ISBN :
978-1-4577-0710-0
DOI :
10.1109/ISOCC.2011.6138639