• DocumentCode
    3145860
  • Title

    High-efficiency broadband power amplifier design technique based on a measured-load-line approach

  • Author

    Di Falco, Sergio ; Raffo, Antonio ; Scappaviva, Francesco ; Resca, Davide ; Pagani, Maurizio ; Vannini, Giorgio

  • Author_Institution
    Dept. of Eng., Univ. of Ferrara, Ferrara, Italy
  • fYear
    2010
  • fDate
    23-28 May 2010
  • Firstpage
    1106
  • Lastpage
    1109
  • Abstract
    The paper presents an innovative power amplifier design technique oriented to microwave applications which require both high efficiency and large bandwidth. The approach is based on a recently proposed technique which, by exploiting a direct low-frequency nonlinear electron device characterization in conjunction with a model-based description of the device capacitances, achieves the same level of accuracy provided by expensive nonlinear setups operating at microwave frequencies. As a tough test-bench, a commercially available discrete power GaN FET has been adopted.
  • Keywords
    III-V semiconductors; gallium compounds; integrated circuit design; integrated circuit measurement; microwave amplifiers; power amplifiers; wide band gap semiconductors; wideband amplifiers; GaN; direct low-frequency nonlinear electron device characterization; high-efficiency broadband power amplifier design technique; measured-load-line approach; microwave applications; Bandwidth; Broadband amplifiers; Capacitance; Electron devices; High power amplifiers; Microwave amplifiers; Microwave devices; Microwave frequencies; Microwave theory and techniques; Power measurement; Broadband amplifiers; Design methodology; FETs; Integrated circuit design; Integrated circuit measurements; Microwave amplifiers; Power amplifiers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-6056-4
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2010.5517729
  • Filename
    5517729