Title :
Variation-aware aging analysis with non-Gaussian parameters
Author :
Choung, Joonee ; Han, Sangwoo ; Kim, Byung-Su ; Kim, Juno
Author_Institution :
Dept. of Comput. Sci. & Eng., Sogang Univ., Seoul, South Korea
Abstract :
Technology scaling brings about increased process variations and aging effects. In this paper, we analyze the effects of process variations on aging effects and the correlations between process variations and aging effects are considered using Monte-Carlo based transistor-level simulations including independent component analysis (ICA) for non-Gaussian parameters. The aging analysis using ICA well reflect the long-tail characteristics by aging effects compared to the principal component analysis (PCA).
Keywords :
Monte Carlo methods; ageing; independent component analysis; semiconductor device models; transistors; ICA; Monte-Carlo based transistor-level simulations; PCA; aging effects; independent component analysis; long-tail characteristics; nonGaussian parameters; principal component analysis; variation-aware aging analysis; HCI; Independent component analysis; aging effect; non-Gaussian; process variation;
Conference_Titel :
SoC Design Conference (ISOCC), 2011 International
Conference_Location :
Jeju
Print_ISBN :
978-1-4577-0709-4
Electronic_ISBN :
978-1-4577-0710-0
DOI :
10.1109/ISOCC.2011.6138653
