• DocumentCode
    3146263
  • Title

    A pseudorandom test environment

  • Author

    Beckwith, Robert F. ; Wood, Bob ; Rioux, Bruce ; Singer, Benjamin

  • Author_Institution
    Mint Technol. Inc., Billerica, MA, USA
  • fYear
    1998
  • fDate
    16-19 Mar 1998
  • Firstpage
    153
  • Lastpage
    157
  • Abstract
    A pseudorandom test environment that utilizes existing self-checking directed tests is presented. A dynamic weighting scheme selects tests to run where the tests are independently configured and the configurations are subject to user constraints. To ensure reproducibility, test selection and configuration derive from a single random seed. The presented framework is capable of running several test instances concurrently. An amalgamation of tests running within the framework effectively synthesizes much more complex test scenarios, which need not be preconceived or generated in any other way. This approach provides the capability of more completely exercising a design with a pre-existing test suite. Additional features and capabilities are also discussed
  • Keywords
    computer testing; random number generation; complex test scenarios; concurrent test instances; dynamic weighting scheme; independently configured tests; pre-existing test suite; pseudorandom test environment; random seed; reproducibility; self-checking directed tests; test configuration; test selection; user constraints; Automatic testing; Costs; Emulation; Libraries; Performance evaluation; Reproducibility of results; Runtime; Symbiosis; Turning; Yarn;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Verilog HDL Conference and VHDL International Users Forum, 1998. IVC/VIUF. Proceedings., 1998 International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1085-9403
  • Print_ISBN
    0-8186-8415-1
  • Type

    conf

  • DOI
    10.1109/IVC.1998.660695
  • Filename
    660695