Title :
Diagnosis of TCM Failures in the IBM 3081 Processor Complex
Author :
Tendolkar, Nandakumar N.
Author_Institution :
International Business Machines Corporation, Poughkeepsie, NY
Abstract :
The concepts of automated diagnostics that were developed for and that are implemented in the IBM 3081 Processor complex are presented in this paper. Significant features of the 3081 diagnostics methodology are the capability to isolate intermittent as well as solid hardware failures and the automatic isolation of a failure to the failing field-replaceable unit (FRU) in a high percentage of the cases. The problem of isolating intermittent faults is solved by a new strategy of dynamic error detection and fault isolation by analysis of data captured at the detection of the error.
Keywords :
Circuit faults; Condition monitoring; Control systems; Data analysis; Error correction; Fault detection; Hardware; Logic arrays; Process control; Solids;
Conference_Titel :
Design Automation, 1983. 20th Conference on
Print_ISBN :
0-8186-0026-8
DOI :
10.1109/DAC.1983.1585648
