DocumentCode :
3146450
Title :
Functional Testing of Digital Systems
Author :
Lai, Kwok-Woon ; Siewiorek, Daniel P.
Author_Institution :
Bell Laboratories, Murray Hill, NJ
fYear :
1983
fDate :
27-29 June 1983
Firstpage :
207
Lastpage :
213
Abstract :
Functional testing is testing aimed at validating the correct operation of a digital system with respect to its functional specification. We have designed and implemented a practical test generation methodology that can generate tests directly from a system´s high-level specification. Solutions adopted include multi-level fault models and multi-stage test generation. Tests generated from the methodology were compared against test programs supplied by a computer manufacturer and were found to detect more faults with much better efficiency. The experiment demonstrated that functional testing can be both practical and efficient. Automatic generation of design validation tests is now closer to reality.
Keywords :
Automatic testing; Circuit faults; Circuit testing; Computer aided manufacturing; Computer architecture; Digital systems; Electrical fault detection; Fault detection; Hardware; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1983. 20th Conference on
ISSN :
0738-100X
Print_ISBN :
0-8186-0026-8
Type :
conf
DOI :
10.1109/DAC.1983.1585650
Filename :
1585650
Link To Document :
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