DocumentCode :
3146583
Title :
A Coverage-Driven Constraint Random-Based Functional Verification Method of Pipeline Unit
Author :
Wu, Yingpan ; Yu, Lixin ; Zhuang, Wei ; Wang, Jianyong
Author_Institution :
Beijing Microelectron. Technol. Inst., Beijing, China
fYear :
2009
fDate :
1-3 June 2009
Firstpage :
1049
Lastpage :
1054
Abstract :
This paper presents a coverage-driven constraint random-based functional verification (CCRFV) method of pipeline unit in a microprocessor. The environment of verification, which is created by means of verification methodology manual (VMM) for SystemVerilog, is reusable and can reduce verification time. The model created by combining classification trees, which can ensure to cover complete coverage and to close the gap from the specification of a test plan to SystemVerilog. Using this environment of verification, we can not only know whether there are bugs in the design under test (DUT) or not, but also can easily locate design errors.
Keywords :
design for testability; hardware description languages; logic design; microprocessor chips; pipeline processing; SystemVerilog; classification trees; coverage-driven constraint random-based functional verification; design under test; microprocessor; pipeline unit; system bugs; verification methodology manual; Classification tree analysis; Computer bugs; Formal verification; Microelectronics; Microprocessors; Object oriented modeling; Paper technology; Pipelines; System testing; Time to market; SystemVerilog; VMM; classification trees; functional verification; pipeline unit;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer and Information Science, 2009. ICIS 2009. Eighth IEEE/ACIS International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3641-5
Type :
conf
DOI :
10.1109/ICIS.2009.34
Filename :
5223257
Link To Document :
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