• DocumentCode
    3146583
  • Title

    A Coverage-Driven Constraint Random-Based Functional Verification Method of Pipeline Unit

  • Author

    Wu, Yingpan ; Yu, Lixin ; Zhuang, Wei ; Wang, Jianyong

  • Author_Institution
    Beijing Microelectron. Technol. Inst., Beijing, China
  • fYear
    2009
  • fDate
    1-3 June 2009
  • Firstpage
    1049
  • Lastpage
    1054
  • Abstract
    This paper presents a coverage-driven constraint random-based functional verification (CCRFV) method of pipeline unit in a microprocessor. The environment of verification, which is created by means of verification methodology manual (VMM) for SystemVerilog, is reusable and can reduce verification time. The model created by combining classification trees, which can ensure to cover complete coverage and to close the gap from the specification of a test plan to SystemVerilog. Using this environment of verification, we can not only know whether there are bugs in the design under test (DUT) or not, but also can easily locate design errors.
  • Keywords
    design for testability; hardware description languages; logic design; microprocessor chips; pipeline processing; SystemVerilog; classification trees; coverage-driven constraint random-based functional verification; design under test; microprocessor; pipeline unit; system bugs; verification methodology manual; Classification tree analysis; Computer bugs; Formal verification; Microelectronics; Microprocessors; Object oriented modeling; Paper technology; Pipelines; System testing; Time to market; SystemVerilog; VMM; classification trees; functional verification; pipeline unit;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer and Information Science, 2009. ICIS 2009. Eighth IEEE/ACIS International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-0-7695-3641-5
  • Type

    conf

  • DOI
    10.1109/ICIS.2009.34
  • Filename
    5223257